Onto Innovation Debuts Sub-surface Defect Inspection for Advanced Packaging
Onto Innovation Inc. (ONTO)
Last onto innovation inc. earnings: 2/6 04:05 pm
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Source: Business Wire
New capability released for the Dragonfly® G3 inspection system enables 100% wafer inspection for critical sub-surface defectsOnto has received multiple orders in support of high bandwidth memory (HBM), advanced logic and a variety of specialty segments WILMINGTON, Mass.--(BUSINESS WIRE)--Onto Innovation Inc. (NYSE: ONTO) today announced the release of a new sub-surface inspection capability for the Dragonfly® G3 sub-micron 2D/3D inspection and metrology platform. The new capability enables whole wafer inspection for critical yield impacting defects that can lead to lost die as well as entire wafers breaking in subsequent process steps. Such defects were previously impossible to find in a production environment. In today’s world of wafer thinning and multi-layer wafer or die bonding, sub-surface defects are far more dangerous than ever before as bonded layers are now a tenth of their former thickness and far more brittle and therefore more susceptible to damage pre- or post-bonding
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- Onto Innovation: The Rally Has Started To Wobble Even Though It Remains Intact [Seeking Alpha]Seeking Alpha
- Onto Innovation (ONTO) Adds New Capability to Dragonfly System [Yahoo! Finance]Yahoo! Finance
- Onto Innovation Debuts Sub-surface Defect Inspection for Advanced Packaging [Yahoo! Finance]Yahoo! Finance
- Onto Innovation Inc. (NYSE: ONTO) is now covered by analysts at Evercore ISI. They set an "outperform" rating and a $235.00 price target on the stock.MarketBeat
- What Makes Onto Innovation (ONTO) a New Buy Stock [Yahoo! Finance]Yahoo! Finance
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